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Features
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- Raman measurements
- Luminiscent measurements
- Laser Reflection and Transmission Measurements
- 3D high-contrast images in reflected light
- 3D Raman confocal measurements
- Information about spectral and polarization propertis of a sample
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Spatial resolution:
- horizontal up to 200 nm
- axial up to 500 nm
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Wide spectral range:
- 785nm: spectral range 50 - 3700cm-1
- 633nm: spectral range 60 - 6700cm-1
- 488nm: spectral range 150 - 10000cm-1
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Simultaneous use of up to 5 lasers by switching over the components inside the system.
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The scanning system provides, alongside with point-to-point scanning, fast scanning (1000x1000 pixel per 3 seconds) of a specimen with PMT signal registration. The scanning area: 130x130 µm
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Specially designed monochromator-spectrograph with unique parameters:
spectral resolution up to 0.006 nm
astigmatism less than 5 µm
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Use of inverted and upright microscopes is possible.
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Telescope with variable magnification for adapting laser beams to entrance pupils of microobjectives from 3 to 12 mm.
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Polarized measurements.
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High sensitivity at low power of laser excitation (from µW to mW).
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Reflection module for simultaneous obtaining of 3D image in reflected light.
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Transmission measurements option.
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Fully automated control of the system.
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High temporal and temperature stability is provided by modular rigid and rod design.
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No fiber optics that decrease some optical parameters (transmission, wave front, polarization).
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Ring illumination for combination with AFM.
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Signal decrease from 90 % to 10 % at 200 nm, λ=514 nm, 100Х immersion lens

Resolution along Z-axis. The reflection from silicon wafer, obtained by moving the objective lens along the Z axis. FW HW - 442 nm, λ=488 nm, 100x objective lens.

Specially designed monochromator-spectrograph with unique parameters: spectral resolution up to 0.006 nm, astigmatism less than 5 µm. Absolute wavelength accuracy: about 0.016 nm (for grating 2400 l/mm). Pinhole spectral image at CCD camera. Pixel size: 12 µm. Pinhole size: 12 µm. Image size: 1.5 pixel

Raman spectrum of Si wafer. Si (4) peak is clearly detected. Si (1) and Si (2) are in deep saturation. Confocal mode. Accumulation time - 60 seconds. 488 nm laser, 5 mW power
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- Bioscience
study of living cells cancerous pre-cancerous tissues, DNA, cytological investigations
- Material science
investigation of physical structure and chemical composition of semiconductors, thin films and other materials and structures
- Nanotechnology
study of physical properties of new carbonic nanomaterials such as graphene and nanotubes, determination of stress and deformation, estimation of structural order
- Geoscience
identification of minerals, detection of sample components distribution and their phases; jewels characterization and inclusions determination
- Heritage and Art
Non-destructive identification of different findings in the result of archeological excavations, identification of pigments, undercoatings on pictures, icons, wall paintings, ceramics
- Organic chemistry
study of chemical reaction mechanisms
- Polymer chemistry
coating technological process monitoring, investigation of polymer materials , including thin films
- Pharmaceutical
determination of distribution of pharmaceutical ingredients in drugs, raw material identification , monitoring and controlling of manufacturing processes
- Cosmetology
ointment, cream investigations as well as their penetration capability
- Forensic science
identification of unknown substances, different types of fibers, glass, paints , explosive materials, narcotic and toxic substances
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