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Laser Elemental
Analyzer
model
LEA-S500

The detailed information about LEA-S500 can be found here:

The LEA-S500 is a Laser Induced Breakdown Spectrometer (Atomic Emission Spectroscopy) with bright analytical performance. The spectrometer combines the advantages of the recent developments in spectroscopy, laser technique and analytical Software. The LEA-S500 is a fully automated spectrometer permitting analysis of the composition of different solids, such as:

  • metals and alloys
  • ceramics
  • glass
  • plastics
  • trace elements in pure materials
  • compacted powder

The specially-designed laser as a spectrum excitation source allows one to analyze conducting/non-conducting materials, to considerably minimize the interaction between elements thus providing a generic calibration curve for a variety of element concentrations and also to eliminate the sample-preparation step.

By varying the laser pulse power, the area and depth of the damage surface one can analyze the composition and thickness of coating layers, thin films, impurities (trace elements, inclusions) and structural components.

The high-resolution spectrograph allows a high-quality aberration-free flat optical field to be obtained.

The multi-element spectrum detection system (2048 pixels CCD camera) ensures the fast data readout.

The triple (mechanical, electronic and Software) protection against laser irradiation provides the LEA-S500 safe operation.

    

  • Ferrous and Nonferrous Metallurgy
  • Mechanical Engineering
  • Building Materials
  • Extraction and Processing of Ore
  • Geological Industry
  • Semiconductor Industry
  • Science of Materials
  • Research in Universities and Laboratories
  • Criminalistics
  • Glass Industry

Table of guaranteed detection limits and concentration ranges
for a number of elements in industrial iron, copper, aluminum and titanium bases alloys

Element Detection Limits,
3s, ppm		 Concentration ranges of elements in different-base alloys, %
Base-Iron Base-Copper Base-Aluminium Base-Titanium
Min Max Min Max Min Max Min Max
Be  0.1      0.0005  2.0  0.0005  2.0     
B  1.2  0.005  0.2             
C  10  0.05  4.5             
Mg  0.5  0.001  0.15      0.01  5.0     
Al  1.0  0.001  2.0  0.01  5.0      0.03  10.0 
Si  5.0  0.005  20.0  0.01  5.0  0.01  17.0  0.06  0.7 
P  10  0.01  0.5  0.05  2.0         
Ti  0.3  0.001  10.0      0.01  2.0     
V  2.0  0.005  10.0          0.05  7.0 
Cr  2.0  0.005  30.0  0.01  1.5  0.01  0.5  0.05  3.0 
Mn  0.5  0.003  18.0  0.003  7.0  0.01  2.0  0.01  3.0 
Fe  1.0      0.01  15.0  0.005  2.0  0.01  2.0 
Co  4.0  0.005  15.0             
Ni  0.8  0.001  40.0  0.01  20.0  0.001  1.0     
Cu  0.5  0.001  10.0      0.01  10.0     
Zn  5.0      0.01  50.0  0.001  2.0     
As  5.0          0.008  0.5     
Zr  1.0          0.01  0.3  0.01  4.0 
Nb  1.0  0.003  1.5             
Mo  1.0  0.005  20.0          0.01  7.0 
Cd  1.0                 
Sn  10.0      0.01  20.0  0.01  2.0  0.05  4.0 
W  5.0  0.01  16.0             
Pb  20.0  0.01  0.5  0.01  15.0  0.01  0.3     
Bi  5.0      0.005  0.1         
Ag  0.3      0.001  0.5         
Sb  10.0      0.005  1.5         
Na  0.1          0.001  1.0     
Ña  1.0                 
Au  4.5                 


OPTICS
   Focal length, mm:
  * Grating, grooves/mm:
  * Wavelength range, nm:
  * Dispersion, nm/mm:
  * Wavelength resolution, nm:

500
1800
190-800
1.0
0.028

500
2400
190-600
0.7
0.020

500
3600
190-400
0.5
0.014
* Note: Any of the diffraction gratings can be used in the device according to the type of the materials the customer needs to analyze.
SAMPLE COMPARTMENT
  Sample size (without adapters): 12x12x2 mm (min), 75x75x40 mm (max)
  Availability of sample displacement along X-Y axes: +/- 5 mm (for averaging of measurement results)
  Analyzed zone size: DIA 0.03 - 1.7 mm
  Environment - Air
  Evacuation (optional)
  Adapters for wire, foil, small size samples
EXCITATION
  Original Q-switched Nd:YAG laser
  Average pulse energy: 100 mJ
  Energy stability: +/- 3% for 99% of pulses
DETECTION
  2048 pixels linear CCD, 14 bit, USB-Interface (other detectors available)
  Full spectrum detection (Panorama)
MINIMUM SYSTEM REQUIREMENTS
  OS: Win 98/ME/2000/XP
  Processor: P-IV / 2GHz or similar
  RAM: 256 Mb
  HDD 40 Gb
  Graphic card: VIVO (Video-In, Video-Out), GeForce-3 (ASUSTeK)
  Monitor 17", min. screen resolution 1024x768, True Color
  CD-R Drive
  Two COM ports (interface RS-232); Port "Ethernet 100 Base-T" (connector RJ-45), USB
  ACCESSORIES: printer, speakers, add. port "Ethernet 100 Base-T" for internal network, CD-RW drive
SOFTWARE for Win 9x/2000/XP
  Automatic wavelengths calibration
  Indication of deviation from the specified type of material
  Control of unaccounted impurities
  Control of quality and reliability of analysis results
  Graphical representation of analytical signal
  Databases for:
     - CRM / RM / SUS
     - spectral lines
     - types of materials
  Printout and mathematical processing of analysis results
ANALYTICAL PROGRAMS
  Analytical programs (methodology) for analysis of:
     - alloys based on aluminium, nickel, copper, titanium etc.
     - any type steel and cast iron
     - conducting and non-conducting materials (plastics, ceramics, glass etc.)
  Qualitative, semiquantitative and quantitative analyses of different materials
  Automatic identification of material type or base element
ANALYSIS TIME
  10 sec to 3 min in one point (depending on the quantity of elements to determine)
POWER REQUIREMENTS
  230VAC, 50/60 Hz
  900 W during measurement, 100 W stand-by
Overall Size (LxWxH): 550 x 750 x 1100 mm;  Weight: 120 kg

The detailed information about LEA-S500 can be found here:
 
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